Seismic thickness delineation using spectral principal component analysis: Theory and a synthetic turbidite example

Zhou, Jian (University of Houston and SGRI) | Castagna, John (University of Houston)


Correlations between isofrequency amplitude traces from spectral decomposition provide a means of finding frequency notches induced by thin layers. Isofrequency traces tend to be strongly correlated between frequencies at spectral nulls; and amongst those that are not at those frequency notches. Spectral principal component (PC) amplitude attributes take advantage of this property, and are indicative of layer thickness. With proper trace scaling and spectral balancing, spectral PC amplitudes are independent of layer reflection coefficients. Layers with only odd and even pair reflection coefficients have distinctive spectral PC-thickness relationships in synthetic wedge models. Three spectral PC attributes individually delineate amplitudes from: 1) an isolated reflection not affected by tuning; 2) tuning of an even reflection pair; and 3) tuning of an odd reflection pair in a 3-D synthetic turbidite model.

Presentation Date: Tuesday, September 26, 2017

Start Time: 11:25 AM

Location: 350D

Presentation Type: ORAL